Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10220355 | Compound for fouling resistance, membrane for fouling resistance, and method of preparing membrane for fouling resistance | Sung Soo HAN | 2019-03-05 |
| 9873622 | Hybrid porous structured material, membrane including the same, and method of preparing hybrid porous structured material | Sung Soo HAN, Pil Jin Yoo, Du Yeol Ryu, Young Hun Kim, Seon Ju Yeo | 2018-01-23 |
| 9165354 | Method of analyzing photolithography processes | Woong-Kyu Son, Deok-Yong Kim, Jae-Kwan Park, Jeong-Ho Ahn, Soo-Bok Chin | 2015-10-20 |
| 9156009 | Membrane, method for manufacturing the same, and composite membrane including the same | Jung-im Han, Sung Soo HAN | 2015-10-13 |
| 8695811 | Hybrid porous structured material, membrane including the same, and method of preparing hybrid porous structure material | Sung Soo HAN, Pil Jin Yoo, Du Yeol Ryu, Young Hun Kim, Seon Ju Yeo | 2014-04-15 |
| 7398178 | Method of determining the irregularities of a hole | — | 2008-07-08 |
| 7126357 | Method for inspecting a wafer and apparatus for inspecting a wafer | — | 2006-10-24 |
| 6913939 | Method for inspecting a wafer and apparatus for inspecting a wafer | — | 2005-07-05 |
| 6545491 | Apparatus for detecting defects in semiconductor devices and methods of using the same | Yang-hyong Kim, Deok-Yong Kim | 2003-04-08 |
| 6525318 | Methods of inspecting integrated circuit substrates using electron beams | Yang-hyong Kim, Deok-Yong Kim, Sang-myun Lee | 2003-02-25 |
| 6100102 | Method of in-line monitoring for shallow pit on semiconductor substrate | Yang-hyong Kim, Chun-ha Hwang, Deok-Yong Kim | 2000-08-08 |