Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332301 | Measuring device defect sensitization in transistor-level circuits | Mayukh Bhattacharya, Jonti Talukdar, Shan-Fu Yuan | 2025-06-17 |
| 11579994 | Fast and scalable methodology for analog defect detectability analysis | Mayukh Bhattacharya, Antony Fan | 2023-02-14 |
| D955471 | 3D printer extruder | Kunpeng Jing | 2022-06-21 |
| 10409941 | Visual representation of circuit related data | Mayukh Bhattacharya, Chih Ping Antony Fan, Vinay Nulkar, Amelia Huimin Shen | 2019-09-10 |