Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579994 | Fast and scalable methodology for analog defect detectability analysis | Mayukh Bhattacharya, Huiping Huang | 2023-02-14 |
| 11361135 | Guiding sample size choice in analog defect or fault simulation | Mayukh Bhattacharya, Mihir Sherlekar | 2022-06-14 |
| 6807520 | System and method for simulation of an integrated circuit design using a hierarchical input netlist and divisions along hierarchical boundaries thereof | Yo Ng Zhou | 2004-10-19 |