Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7403278 | Surface inspection apparatus and surface inspection method | Yoshinori Hayashi, Makoto Kyoya, Koji Izunome, Hiromi Nagahama, Miyuki Shimizu +1 more | 2008-07-22 |
| 7149341 | Wafer inspection apparatus | Yoshinori Hayashi, Hiroaki Yuda, Atsushi Tanabe, Hiromichi Isogai, Koji Izunome | 2006-12-12 |