Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7149341 | Wafer inspection apparatus | Yoshinori Hayashi, Hiroyuki Naraidate, Atsushi Tanabe, Hiromichi Isogai, Koji Izunome | 2006-12-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7149341 | Wafer inspection apparatus | Yoshinori Hayashi, Hiroyuki Naraidate, Atsushi Tanabe, Hiromichi Isogai, Koji Izunome | 2006-12-12 |