Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9885753 | Scan systems and methods | Amit Sanghani, Venkata Kottapalli, Milind Sonawane, Ketan Kulkarni | 2018-02-06 |
| 6751764 | Method and apparatus for testing and debugging a circuit | Sai V. Vishwanthaiah | 2004-06-15 |
| 6675338 | Internally generated vectors for burnin system | — | 2004-01-06 |
| 6671841 | Method for on-line circuit debug using JTAG and shadow scan in a microprocessor | — | 2003-12-30 |
| 6662325 | Apparatus for on-line circuit debug using JTAG and shadow scan in a microprocessor | — | 2003-12-09 |
| 6581018 | Multiplexer select line exclusivity check method and apparatus | — | 2003-06-17 |
| 6219812 | Apparatus and method for interfacing boundary-scan circuitry with DTL output drivers | — | 2001-04-17 |
| 5892778 | Boundary-scan circuit for use with linearized impedance control type output drivers | Marc E. Levitt | 1999-04-06 |
| 5872796 | Method for interfacing boundary-scan circuitry with linearized impedance control type output drivers | Marc E. Levitt | 1999-02-16 |