| 7991046 |
Calibrating jitter |
Ronald A. Sartschev, Li-Ju Huang |
2011-08-02 |
| 7856578 |
Strobe technique for test of digital signal timing |
Ronald A. Sartschev |
2010-12-21 |
| 7574632 |
Strobe technique for time stamping a digital signal |
Ronald A. Sartschev |
2009-08-11 |
| 7573957 |
Strobe technique for recovering a clock in a digital signal |
Ronald A. Sartschev |
2009-08-11 |
| 7508228 |
Method and system for monitoring test signals for semiconductor devices |
Ronald A. Sartschev |
2009-03-24 |
| 7403030 |
Using parametric measurement units as a source of power for a device under test |
Ron Sartschev |
2008-07-22 |
| 7271610 |
Using a parametric measurement unit to sense a voltage at a device under test |
Ron Sartschev |
2007-09-18 |
| 7256600 |
Method and system for testing semiconductor devices |
Ronald A. Sartschev |
2007-08-14 |
| 7135881 |
Method and system for producing signals to test semiconductor devices |
Ronald A. Sartschev |
2006-11-14 |
| 7102375 |
Pin electronics with high voltage functionality |
Ronald A. Sartschev |
2006-09-05 |
| 7023366 |
Using a parametric measurement unit for converter testing |
Ronald A. Sartschev |
2006-04-04 |
| 6448575 |
Temperature control structure |
Alexander H. Slocum, Andreas C. Pfahnl, Ronald A. Sartschev |
2002-09-10 |
| 6374379 |
Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
Ronald A. Sartschev, Allan M. Ryan, Jr., Eric D. Blom |
2002-04-16 |
| 6282682 |
Automatic test equipment using sigma delta modulation to create reference levels |
Ronald A. Sartschev, Allan M. Ryan, Jr., Eric D. Blom |
2001-08-28 |
| 6049901 |
Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
Mary C. Stock, Raymond L. Strouble |
2000-04-11 |
| 5657486 |
Automatic test equipment with pipelined sequencer |
Allen J. Czamara, Romas P. Rudis |
1997-08-12 |
| 4816750 |
Automatic circuit tester control system |
Robert H. Van der Kloot, David L. Sulman |
1989-03-28 |