| 11514958 |
Apparatus and method for operating source synchronous devices |
Jan Paul Anthonie van der Wagt, Nathan Nary, Grady Borders |
2022-11-29 |
| 9397670 |
Edge generator-based phase locked loop reference clock generator for automated test system |
Jan Paul Anthonie van der Wagt, Jeffrey Wade Sanders, Thomas Aquinas Repucci |
2016-07-19 |
| 9279857 |
Automated test system with edge steering |
Howard Lin, Corbin L. Champion, Jan Paul Anthonie van der Wagt |
2016-03-08 |
| 9244126 |
Automated test system with event detection capability |
Edward J. Seng, Marc Reuben Hutner |
2016-01-26 |
| 9147620 |
Edge triggered calibration |
Jan Paul Anthonie van der Wagt, Gregory A. Kannall |
2015-09-29 |
| 8289039 |
Pin electronics liquid cooled multi-module for high performance, low cost automated test equipment |
Keith J. Breinlinger, Edward Ostertag, Nicholas J. Teneketges |
2012-10-16 |
| 7991046 |
Calibrating jitter |
Ernest P. Walker, Li-Ju Huang |
2011-08-02 |
| 7856578 |
Strobe technique for test of digital signal timing |
Ernest P. Walker |
2010-12-21 |
| 7573957 |
Strobe technique for recovering a clock in a digital signal |
Ernest P. Walker |
2009-08-11 |
| 7574632 |
Strobe technique for time stamping a digital signal |
Ernest P. Walker |
2009-08-11 |
| 7560947 |
Pin electronics driver |
— |
2009-07-14 |
| 7508228 |
Method and system for monitoring test signals for semiconductor devices |
Ernest P. Walker |
2009-03-24 |
| 7323898 |
Pin electronics driver |
— |
2008-01-29 |
| 7256600 |
Method and system for testing semiconductor devices |
Ernest P. Walker |
2007-08-14 |
| 7135881 |
Method and system for producing signals to test semiconductor devices |
Ernest P. Walker |
2006-11-14 |
| 7102375 |
Pin electronics with high voltage functionality |
Ernest P. Walker |
2006-09-05 |
| 7023366 |
Using a parametric measurement unit for converter testing |
Ernest P. Walker |
2006-04-04 |
| 6868047 |
Compact ATE with time stamp system |
Jun Xu |
2005-03-15 |
| 6771061 |
High speed tester with narrow output pulses |
Jun Xu |
2004-08-03 |
| 6448575 |
Temperature control structure |
Alexander H. Slocum, Andreas C. Pfahnl, Ernest P. Walker |
2002-09-10 |
| 6374379 |
Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
Ernest P. Walker, Allan M. Ryan, Jr., Eric D. Blom |
2002-04-16 |
| 6291981 |
Automatic test equipment with narrow output pulses |
— |
2001-09-18 |
| 6282682 |
Automatic test equipment using sigma delta modulation to create reference levels |
Ernest P. Walker, Allan M. Ryan, Jr., Eric D. Blom |
2001-08-28 |
| 6073259 |
Low cost CMOS tester with high channel density |
Gerald F. Muething, Jr. |
2000-06-06 |