Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6049901 | Test system for integrated circuits using a single memory for both the parallel and scan modes of testing | Raymond L. Strouble, Ernest P. Walker | 2000-04-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6049901 | Test system for integrated circuits using a single memory for both the parallel and scan modes of testing | Raymond L. Strouble, Ernest P. Walker | 2000-04-11 |