Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345570 | Method for matching a coating of any gloss level | Margot Julia Vlot, Unnikrishnan Koodali Thazhathuveetil | 2025-07-01 |
| 11900507 | Visualizing wood staining | Margot Julia Vlot, Peter Mark Spiers | 2024-02-13 |
| 10375148 | Colour variant selection method using a mobile device | Swie Lan Njo, Jeroen Hoogink | 2019-08-06 |
| 9791318 | Display of effect coatings on electronic display devices | Roelof Johannes Baptist Gottenbos, André Half, Ivo Bernardus Nicolaas Van Der Lans | 2017-10-17 |
| D742938 | Tire protection mount | Merle Benoit | 2015-11-10 |
| 9135886 | Colour calibration of electronic display screens | Ivo Bernardus Nicolaas Van Der Lans, Swie Lan Njo, André Half, Roelof Johannes Baptist Gottenbos | 2015-09-15 |
| 8979106 | Tire protection mount | Merle Benoit | 2015-03-17 |
| 7804597 | Method for matching paint | Klaas Hendrik De Haas, Swie Lan Njo, Roelof Johannes Baptist Gottenbos | 2010-09-28 |
| 7115425 | Integrated circuit process monitoring and metrology system | Peter A. Burke, James R. B. Elmer | 2006-10-03 |
| 6964924 | Integrated circuit process monitoring and metrology system | Peter A. Burke, James R. B. Elmer | 2005-11-15 |
| 6692338 | Through-pad drainage of slurry during chemical mechanical polishing | — | 2004-02-17 |
| 6472316 | Photolithography overlay control | James R. B. Elmer | 2002-10-29 |
| 6254456 | Modifying contact areas of a polishing pad to promote uniform removal rates | Jayashree Kalpathy-Cramer | 2001-07-03 |
| 6093280 | Chemical-mechanical polishing pad conditioning systems | Jayashree Kalpathy-Cramer | 2000-07-25 |
| 5913715 | Use of hydrofluoric acid for effective pad conditioning | Jayashree Kalpathy-Cramer | 1999-06-22 |
| 5888121 | Controlling groove dimensions for enhanced slurry flow | Jayashree Kalpathy-Cramer | 1999-03-30 |
| 5835226 | Method for determining optical constants prior to film processing to be used improve accuracy of post-processing thickness measurements | Michael Berman, Jayashree Kalpathy-Cramer, Thomas F. A. Bibby | 1998-11-10 |