Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7606677 | Dynamic measurement control | Gary Janik, John Fielden | 2009-10-20 |
| 7345306 | Corona based charge voltage measurement | Sergio Edelstein, Jianou Shi, Shiyou Pei, Xiafang Zhang | 2008-03-18 |
| 7109735 | Method for measuring gate dielectric properties for three dimensional transistors | Gary Janik | 2006-09-19 |
| 7098050 | Corona based charge voltage measurement | Sergio Edelstein, Jianou Shi, Shiyou Pei, Xiafang Zhang | 2006-08-29 |