Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12353967 | Method and apparatus for determining feature contribution to performance | Vahid BASTANI, Dag Sonntag, Reza SAHRAEIAN | 2025-07-08 |
| 11740560 | Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process | Eleftherios KOULIERAKIS, Carlo LANCIA, Juan Manuel Gonzalez Huesca, Alexander Ypma, Reza SAHRAEIAN | 2023-08-29 |
| 11579534 | Extracting a feature from a data set | Maialen LARRANAGA, Faegheh Hasibi, Alexander Ypma | 2023-02-14 |
| 11520238 | Optimizing an apparatus for multi-stage processing of product units | Jelle Nije, Alexander Ypma, Georgios TSIROGIANNIS, Robert Jan Van Wijk, Tzu-Chao CHEN +3 more | 2022-12-06 |
| 11150562 | Optimizing an apparatus for multi-stage processing of product units | Jelle Nije, Alexander Ypma, Georgios TSIROGIANNIS, Robert Jan Van Wijk, Tzu-Chao CHEN +3 more | 2021-10-19 |
| 11099486 | Generating predicted data for control or monitoring of a production process | Alexander Ypma, Georgios TSIROGIANNIS, Thomas Leo Maria Hoogenboom, Richard Johannes Franciscus Van Haren | 2021-08-24 |