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Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory |
Rohit Bhasin, Shishir Kumar, Tanmoy Roy |
2023-08-29 |
| 11025252 |
Circuit for detection of single bit upsets in generation of internal clock for memory |
Shishir Kumar, Tanuj KUMAR |
2021-06-01 |
| 10998077 |
Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory |
Rohit Bhasin, Shishir Kumar, Tanmoy Roy |
2021-05-04 |
| 10637447 |
Low voltage, master-slave flip-flop |
Alok Tripathi, Amit Verma, Anuj Grover, Tanmoy Roy, Tanuj Agrawal |
2020-04-28 |
| 10277207 |
Low voltage, master-slave flip-flop |
Alok Tripathi, Amit Verma, Anuj Grover, Tanmoy Roy, Tanuj Agrawal |
2019-04-30 |