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Reusable test chip for inline probing of three dimensionally arranged experiments |
Christopher Hess, John Kibarian, Amit Joag, Abdul Mobeen Mohammed, Ben Shieh |
2013-01-29 |
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System and method for product yield prediction |
Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more |
2010-03-02 |
| 7373625 |
System and method for product yield prediction |
Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more |
2008-05-13 |
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System and method for product yield prediction |
Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more |
2008-04-08 |
| 7174521 |
System and method for product yield prediction |
Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more |
2007-02-06 |
| 7024642 |
Extraction method of defect density and size distributions |
Christopher Hess, Brian E. Stine, Larg Weiland, Richard Burch, Dennis Ciplickas |
2006-04-04 |
| 6901564 |
System and method for product yield prediction |
Brian E. Stine, Christopher Hess, John Kibarian, Kimon Michaels, Joseph C. Davis +4 more |
2005-05-31 |
| 6795952 |
System and method for product yield prediction using device and process neighborhood characterization vehicle |
Brian E. Stine, Sherry Lee, Kurt H. Weiner |
2004-09-21 |