Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11713964 | Cathodoluminescence focal scans to characterize 3D NAND CH profile | Ido Almog, Ronny Barnea | 2023-08-01 |
| 11525777 | Optimizing signal-to-noise ratio in optical imaging of defects on unpatterned wafers | Yechiel Kapoano, Binyamin Kirshner | 2022-12-13 |
| 11474437 | Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wafers | Yechiel Kapoano, Binyamin Kirshner | 2022-10-18 |
| 11105740 | Optical inspection | Amir Shoham, Binyamin Kirshner, Nitzan Chamiel | 2021-08-31 |