Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12278086 | Pattern height metrology using an e-beam system | Gian Francesco Lorusso, Mohamed Saib, Alain Moussa, Anne-Laure Charley, Joren Severi | 2025-04-15 |
| 10818504 | Method for producing a pattern of features by lithography and etching | Waikin Li, Sandip Halder, Frederic Lazzarino | 2020-10-27 |