AC

Anne-Laure Charley

IV Imec Vzw: 1 patents #463 of 1,046Top 45%
KL Katholieke Universiteit Leuven: 1 patents #233 of 754Top 35%
📍 Hamme-Mille, BE: #10 of 16 inventorsTop 65%
Overall (All Time): #2,406,095 of 4,157,543Top 60%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12278086 Pattern height metrology using an e-beam system Gian Francesco Lorusso, Mohamed Saib, Alain Moussa, Danilo De Simone, Joren Severi 2025-04-15