Issued Patents All Time
Showing 25 most recent of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10006863 | Adjustment of measurement system components | Areef A. Moin | 2018-06-26 |
| 9329054 | Adjustment of measurement system components | Areef A. Moin | 2016-05-03 |
| 7957920 | Milking machine testing | Lars Innings | 2011-06-07 |
| 7492170 | Probe based information storage for probes used for opens detection in in-circuit testing | Curtis Tesdahl | 2009-02-17 |
| 7109728 | Probe based information storage for probes used for opens detection in in-circuit testing | Curtis Tesdahl | 2006-09-19 |
| 7026846 | Synthesizer structures and methods that reduce spurious signals | Roger B. Huntley, Jr., Jon T. Baird, Ken Gentile, Reuben P. Nelson | 2006-04-11 |
| 6930494 | Capacitive probe assembly with flex circuit | Curtis Tesdahl | 2005-08-16 |
| 6901336 | Method and apparatus for supplying power, and channeling analog measurement and communication signals over single pair of wires | Curtis Tesdahl, Kevin G. Chandler | 2005-05-31 |
| 6876214 | Method and apparatus for configurable hardware augmented program generation | John E. McDermid | 2005-04-05 |
| 6636061 | Method and apparatus for configurable hardware augmented program generation | John E. McDermid | 2003-10-21 |
| 6621354 | Feedback methods and systems for rapid switching of oscillator frequencies | John J. Kornblum | 2003-09-16 |
| 6549079 | Feedback systems for enhanced oscillator switching time | — | 2003-04-15 |
| 6529019 | Multiple axis magnetic test for open integrated circuit pins | Philip N. King, John E. McDermid | 2003-03-04 |
| 6522206 | Adaptive feedback-loop controllers and methods for rapid switching of oscillator frequencies | John J. Kornblum | 2003-02-18 |
| 6377901 | Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time | Steven K List | 2002-04-23 |
| 6324486 | Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time | Steven K List, Stephen P. Rozum, Eddie Williamson | 2001-11-27 |
| 5898325 | Dual tunable direct digital synthesizer with a frequency programmable clock and method of tuning | Thomas E. Tice, James A. Surber, Jr. | 1999-04-27 |
| 5703519 | Drive circuit and method for controlling the cross point levels of a differential CMOS switch drive signal | Ernest T. Stroud | 1997-12-30 |
| 5696451 | Identification of pin-open faults by capacitive coupling | Kevin W. Keirn | 1997-12-09 |
| 5661422 | High speed saturation prevention for saturable circuit elements | Thomas E. Tice, Kevin M. Kattmann, Charles D. Lane | 1997-08-26 |
| 5625292 | System for measuring the integrity of an electrical contact | Kevin W. Keirn, Ugur Cilingiroglu | 1997-04-29 |
| 5557209 | Identification of pin-open faults by capacitive coupling through the integrated circuit package | Kevin W. Keirn, Ugur Cilingiroglu | 1996-09-17 |
| 5530444 | Differential amplifiers which can form a residue amplifier in sub-ranging A/D converters | Thomas E. Tice, Kevin M. Kattmann, Charles D. Lane | 1996-06-25 |
| 5498964 | Capacitive electrode system for detecting open solder joints in printed circuit assemblies | Ronald K. Kerschner, Lisa M. Kent | 1996-03-12 |
| 5479119 | High speed active overvoltage detection and protection for overvoltage sensitive circuits | Thomas E. Tice, Kevin M. Kattmann, Charles D. Lane | 1995-12-26 |