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Method and tester for verifying the electrical connection integrity of a component to a substrate |
Tak Yee Kwan |
2010-06-15 |
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Method for using internal semiconductor junctions to aid in non-contact testing |
Myron J. Schneider |
2008-02-05 |
| 7242198 |
Method for using internal semiconductor junctions to aid in non-contact testing |
Myron J. Schneider |
2007-07-10 |
| 7075307 |
Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements |
— |
2006-07-11 |
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Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodes |
— |
2006-06-06 |
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Kevin Wible, Stephen P. Rozum |
2004-11-30 |
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David T. Crook, Steven K List, Stephen P. Rozum |
2001-11-27 |
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Integrated circuit transfer test device system |
— |
1988-10-18 |
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Reversed IC test device and method |
— |
1988-10-18 |