Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10928423 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Michael Andres, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2021-02-23 |
| 10067164 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Michael Andres, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2018-09-04 |
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Michael Andres, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2017-07-04 |