Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12235216 | Optical imaging system and biochemical substance detection system using same | HEMING JIANG, Yi-Shih Huang, Qian Deng, Bin Yang, Xin WEN +5 more | 2025-02-25 |
| 12117396 | Biochemical substance analysis system, method, and device | HEMING JIANG, Chutian Xing, Joon Mo Yang, XIANGKUN SUI, Jian Liu +8 more | 2024-10-15 |
| 9917990 | Imaging systems with movable scan mirrors | Bryan P. Staker | 2018-03-13 |
| 9628676 | Imaging systems with movable scan mirrors | Bryan P. Staker | 2017-04-18 |
| 9488823 | Techniques for scanned illumination | Bryan P. Staker | 2016-11-08 |
| 9285578 | Method for imaging high density biochemical arrays with sub-pixel alignment | Bryan P. Staker | 2016-03-15 |
| 8965196 | Method and system for imaging high density biochemical arrays with sub-pixel alignment | Bryan P. Staker | 2015-02-24 |
| 8660421 | Method and system for imaging high density biochemical arrays with sub-pixel alignment | Bryan P. Staker | 2014-02-25 |
| 8428454 | Method and system for imaging high density biochemical arrays with sub-pixel alignment | Bryan P. Staker | 2013-04-23 |
| 8175452 | Method and system for imaging high density biochemical arrays with sub-pixel alignment | Bryan P. Staker | 2012-05-08 |
| 6987832 | Calibration and alignment of X-ray reflectometric systems | Louis N. Koppel, Jon Opsal | 2006-01-17 |
| 6940596 | Refractive focusing element for spectroscopic ellipsometry | Jianhui Chen | 2005-09-06 |
| 6934025 | Thin film optical measurement system and method with calibrating ellipsometer | Jon Opsal, Jeffrey T. Fanton | 2005-08-23 |
| 6885019 | Sample positioning system to improve edge measurements | Jeffrey T. Fanton | 2005-04-26 |
| 6829049 | Small spot spectroscopic ellipsometer with refractive focusing | Jianhui Chen | 2004-12-07 |
| 6768785 | Calibration and alignment of X-ray reflectometric systems | Louis N. Koppel, Jon Opsal | 2004-07-27 |
| 6753962 | Thin film optical measurement system and method with calibrating ellipsometer | Jon Opsal, Jeffrey T. Fanton | 2004-06-22 |
| 6744850 | X-ray reflectance measurement system with adjustable resolution | Jeffrey T. Fanton, Louis N. Koppel | 2004-06-01 |
| 6707056 | Stage rotation system to improve edge measurements | Jeffrey T. Fanton | 2004-03-16 |
| 6643354 | Calibration and alignment of X-ray reflectometric systems | Louis N. Koppel, Jon Opsal | 2003-11-04 |
| 6515746 | Thin film optical measurement system and method with calibrating ellipsometer | Jon Opsal, Jeffrey T. Fanton | 2003-02-04 |
| 6453006 | Calibration and alignment of X-ray reflectometric systems | Louis N. Koppel, Jon Opsal | 2002-09-17 |