Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6987832 | Calibration and alignment of X-ray reflectometric systems | Craig E. Uhrich, Jon Opsal | 2006-01-17 |
| 6770886 | Detector-shield assembly for X-ray reflectometric system | Charles Schmelz | 2004-08-03 |
| 6768785 | Calibration and alignment of X-ray reflectometric systems | Craig E. Uhrich, Jon Opsal | 2004-07-27 |
| 6744850 | X-ray reflectance measurement system with adjustable resolution | Jeffrey T. Fanton, Craig E. Uhrich | 2004-06-01 |
| 6643354 | Calibration and alignment of X-ray reflectometric systems | Craig E. Uhrich, Jon Opsal | 2003-11-04 |
| 6507634 | System and method for X-ray reflectometry measurement of low density films | William J. Johnson | 2003-01-14 |
| 6453006 | Calibration and alignment of X-ray reflectometric systems | Craig E. Uhrich, Jon Opsal | 2002-09-17 |
| 5619548 | X-ray thickness gauge | — | 1997-04-08 |