Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6649883 | Method of calibrating a semiconductor wafer drying apparatus | Yoshio Iwamoto, James C. Lenk, Philip Schmidt, Leslie George Stanton | 2003-11-18 |
| 6318389 | Apparatus for cleaning semiconductor wafers | Philip Schmidt, Jon Seilkop | 2001-11-20 |