CH

Cheryl Hartfield

OM Omniprobe: 6 patents #4 of 12Top 35%
TI Texas Instruments: 4 patents #3,281 of 12,488Top 30%
OL Oxford Instruments Nanotechnology Tools Limited: 1 patents #23 of 61Top 40%
Overall (All Time): #460,962 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
9704689 Method of reducing the thickness of a target sample Christian Lang, Peter Statham 2017-07-11
9349573 Total release method for sample extraction in an energetic-beam instrument Rocky Kruger, Gonzalo Amador 2016-05-24
9097625 Gas injection system for energetic-beam instruments Rocky Kruger, Aaron C. Smith 2015-08-04
8759765 Method for processing samples held by a nanomanipulator Thomas M. Moore, Brian P. Miller 2014-06-24
8513622 Method for extracting frozen specimens and manufacture of specimen assemblies 2013-08-20
8440969 Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images Thomas M. Moore, Gregory A. Magel 2013-05-14
7495749 Rapid method for sub-critical fatigue crack growth evaluation Darvin R. Edwards 2009-02-24
7225681 Statistical method for identifying microcracks in insulators Daniel Stillman, Nancy R. Ota 2007-06-05
6752012 Combined electrical test and mechanical test system for thin film characterization Jerry J. Broz, Reynaldo Rincon 2004-06-22
6435398 Method for chemically reworking metal layers on integrated circuit bond pads Thomas M. Moore 2002-08-20
6420722 Method for sample separation and lift-out with one cut Thomas M. Moore, Rocky Kruger 2002-07-16