JB

Jerry J. Broz

IS International Test Solutions: 18 patents #2 of 12Top 20%
TI Texas Instruments: 4 patents #3,281 of 12,488Top 30%
📍 Longmont, CO: #130 of 2,039 inventorsTop 7%
🗺 Colorado: #1,705 of 40,980 inventorsTop 5%
Overall (All Time): #193,481 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
11756811 Pick and place machine cleaning system and method Alan E. Humphrey, Bret A. Humphrey, Wayne C. Smith 2023-09-12
11318550 System and method for cleaning wire bonding machines using functionalized surface microfeatures Alan E. Humphrey, Bret A. Humphrey, Alex S. Poles, Wayne C. Smith, Janakraj Shivlal 2022-05-03
11211242 System and method for cleaning contact elements and support hardware using functionalized surface microfeatures Alan E. Humphrey, Bret A. Humphrey, Alex S. Poles 2021-12-28
11035898 Device and method for thermal stabilization of probe elements using a heat conducting wafer Alan E. Humphrey, Wayne C. Smith, Mark M. Stark 2021-06-15
10896828 Wafer manufacturing cleaning apparatus, process and method of use Alan E. Humphrey, James H. Duvall 2021-01-19
10792713 Pick and place machine cleaning system and method Alan E. Humphrey, Bret A. Humphrey, Wayne C. Smith 2020-10-06
10741420 Wafer manufacturing cleaning apparatus, process and method of use Alan E. Humphrey, James H. Duvall 2020-08-11
10406568 Working surface cleaning system and method Alan E. Humphrey, James H. Duvall 2019-09-10
10239099 Working surface cleaning system and method Alan E. Humphrey, James H. Duvall 2019-03-26
10195648 Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware Bret A. Humphrey, Alan E. Humphrey, James H. Duvall 2019-02-05
10109504 Wafer manufacturing cleaning apparatus, process and method of use Alan E. Humphrey, James H. Duvall 2018-10-23
10002776 Wafer manufacturing cleaning apparatus, process and method of use Alan E. Humphrey, James H. Duvall 2018-06-19
9833818 Working surface cleaning system and method Alan E. Humphrey, James H. Duvall 2017-12-05
9595456 Wafer manufacturing cleaning apparatus, process and method of use Alan E. Humphrey, James H. Duvall 2017-03-14
8801869 Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware Bret A. Humphrey, Alan E. Humphrey, James H. Duvall 2014-08-12
8790466 Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware Alan E. Humphrey, Bret A. Humphrey, James H. Luvall 2014-07-29
8371316 Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware Alan E. Humphrey, Bret A. Humphrey, James H. Duvall 2013-02-12
7202683 Cleaning system, device and method Gene Humphrey, Joyce Adams 2007-04-10
6911834 Multiple contact vertical probe solution enabling Kelvin connection benefits for conductive bump probing Scott W. Mitchell, Reynaldo Rincon, Gerard Laugier 2005-06-28
6906539 High density, area array probe card apparatus Lester Wilson, Reynaldo Rincon, Richard W. Arnold 2005-06-14
6752012 Combined electrical test and mechanical test system for thin film characterization Cheryl Hartfield, Reynaldo Rincon 2004-06-22
6720780 High density probe card apparatus and method of manufacture Reynaldo Rincon, Lester Wilson, Richard W. Arnold 2004-04-13