| 10515069 |
Utilization of a concept to obtain data of specific interest to a user from one or more data storage locations |
Thomas P. Bishop, Olushola O. Esho, Jordan R. McCoy |
2019-12-24 |
| 10445310 |
Utilization of a concept to obtain data of specific interest to a user from one or more data storage locations |
Thomas P. Bishop, Olushola O. Esho, Jordan R. McCoy |
2019-10-15 |
| 7898275 |
Known good die using existing process infrastructure |
Weldon Beardain, Daniel W. Prevedel, Donald E. Riley, Lester Wilson |
2011-03-01 |
| 7181457 |
System and method for utilizing compression in database caches to facilitate access to database information |
Rob Reinauer, Ken White, Chunsheng Sun, Sunil Jacob, Desmond Tan +1 more |
2007-02-20 |
| 7122895 |
Stud-cone bump for probe tips used in known good die carriers |
Weldon Beardain, Lester Wilson, James A. Forster |
2006-10-17 |
| 7026833 |
Multiple-chip probe and universal tester contact assemblage |
Reynaldo Rincon |
2006-04-11 |
| 6996584 |
System and method of maintaining functional client side data cache coherence |
Ken White, Rob Reinauer, Chunsheng Sun, Sunil Jacob, Desmond Tan +1 more |
2006-02-07 |
| 6988165 |
System and method for intelligent write management of disk pages in cache checkpoint operations |
Ken White, Rob Reinauer, Chunsheng Sun, Sunil Jacob, Desmond Tan +1 more |
2006-01-17 |
| 6970005 |
Multiple-chip probe and universal tester contact assemblage |
Reynaldo Rincon |
2005-11-29 |
| 6906539 |
High density, area array probe card apparatus |
Lester Wilson, Reynaldo Rincon, Jerry J. Broz |
2005-06-14 |
| 6720780 |
High density probe card apparatus and method of manufacture |
Reynaldo Rincon, Jerry J. Broz, Lester Wilson |
2004-04-13 |
| 6720574 |
Method of testing a semiconductor chip |
Weldon Beardain, Daniel W. Prevedel, Donald E. Riley, Lester Wilson |
2004-04-13 |
| 6636063 |
Probe card with contact apparatus and method of manufacture |
James A. Forster, Reynaldo Rincon, Lester Wilson |
2003-10-21 |
| 6553661 |
Semiconductor test structure having a laser defined current carrying structure |
Lester Wilson, James A. Forster |
2003-04-29 |
| 6489673 |
Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriers |
Lester Wilson, Mahmood A. Siddiqui, James A. Forster |
2002-12-03 |
| 6376352 |
Stud-cone bump for probe tips used in known good die carriers |
Weldon Beardain, Lester Wilson, James A. Forster |
2002-04-23 |
| 6335226 |
Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriers |
Lester Wilson, Mahmood A. Siddiqui, James A. Forster |
2002-01-01 |
| 6276563 |
Verification and lockout apparatus for bulk feeder |
Joe M. Saldana, Andrew D. Alexander, Michael J. Pomeroy, Richardo Garza, James L. McGovern |
2001-08-21 |
| 6209532 |
Soft handling process tooling for low and medium volume known good die product |
Lester Wilson |
2001-04-03 |
| 5649981 |
Tool and fixture for the removal of tab leads bonded to semiconductor die pads |
Lloyd W. Darnell |
1997-07-22 |
| 5647763 |
Multi-media cross connect system |
Richard E. Woodrum |
1997-07-15 |
| 5591649 |
Process of removing a tape automated bonded semiconductor from bonded leads |
Lloyd W. Darnell |
1997-01-07 |
