Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11688582 | Navigation for electron microscopy | Anthony Hyde, James Holland, Simon Burgess, Philippe Pinard, James Corrin | 2023-06-27 |
| 11195692 | System for electron diffraction analysis | Angus Bewick | 2021-12-07 |
| 10354414 | Material identification using multiple images | — | 2019-07-16 |
| 10354834 | X-ray analysis in air | — | 2019-07-16 |
| 10054557 | Method for measuring the mass thickness of a target sample for electron microscopy | — | 2018-08-21 |
| 10018737 | Method of processing a particle spectrum | — | 2018-07-10 |
| 9704688 | X-ray analysis in air | — | 2017-07-11 |
| 9704689 | Method of reducing the thickness of a target sample | Christian Lang, Cheryl Hartfield | 2017-07-11 |
| 8890065 | Apparatus and method for performing microdiffraction analysis | Angus Bewick | 2014-11-18 |
| 8421027 | Charged particle analyser and method using electrostatic filter grids to filter charged particles | Ian Richard Barkshire, Marcus Jacka | 2013-04-16 |
| 8346521 | Method of determining the feasibility of a proposed structure analysis process | Charles Penman | 2013-01-01 |
| 8222598 | Method for quantitative analysis of a material | Ian Richard Barkshire | 2012-07-17 |
| 8065094 | Method of calculating the structure of an inhomogeneous sample | — | 2011-11-22 |
| 7595489 | Method and apparatus for material identification | — | 2009-09-29 |
| 7533000 | Method and apparatus for analysing a dataset of spectra | Charles Penman | 2009-05-12 |
| 5357110 | Visual color mapping X-ray analysis apparatus | — | 1994-10-18 |