CC

Calvin K. Chi

IBM: 1 patents #44,794 of 70,183Top 65%
Overall (All Time): #3,794,037 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5298975 Combined scanning force microscope and optical metrology tool Henri A. Khoury, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein, Martin P. O'Boyle +2 more 1994-03-29