Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10928423 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry +1 more | 2021-02-23 |
| 10330702 | Wafer level integrated circuit probe array and method of construction | Jathan D. Edwards, Charles Marks | 2019-06-25 |
| 10078101 | Wafer level integrated circuit probe array and method of construction | Jathan D. Edwards, Charles Marks | 2018-09-18 |
| 10067164 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry +1 more | 2018-09-04 |
| 9817026 | Wafer level integrated circuit contactor and method of construction | Jathan D. Edwards, Charles Marks | 2017-11-14 |
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry +1 more | 2017-07-04 |
| 9261537 | Wafer level integrated circuit contactor and method of construction | Jathan D. Edwards, Charles Marks | 2016-02-16 |