Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299517 | Communication tag and electronic device | Yunpeng Shen, Jiahui Chu, Tengfei Huang, Xuming Chen, Jing Zhao | 2025-05-13 |
| 12261493 | Motor, compressor, and refrigeration device | Fei Xu, Xiaohua Qiu | 2025-03-25 |
| 12199473 | Rotor, motor, compressor, and refrigeration apparatus | Fei Xu, Xiaohua Qiu | 2025-01-14 |
| 12129930 | Nut, electronic expansion valve and stop structure thereof, and refrigeration device | Longhua HUANG, Chao-Chuan Chen, Mao YANG | 2024-10-29 |
| 12123632 | Compressor and refrigeration device | Xiaohan Zhu, Xingbiao Zhou, Shumin Lin, Qiang Gu | 2024-10-22 |
| 12085076 | Scroll structure and compressor with back pressure plate and floating plate | Canyu QIAN, Osamu Aiba, Baiying Huang, Xiaolei Li, Hidenobu Shintaku | 2024-09-10 |
| 11867439 | Stator assembly, electronic expansion valve and refrigeration device | Chao-Chuan Chen, Longhua HUANG, Mao YANG | 2024-01-09 |
| 7381575 | Device and method for detecting alignment of active areas and memory cell structures in DRAM devices | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Chin-Ling Huang | 2008-06-03 |
| 7217581 | Misalignment test structure and method thereof | Chien-Chang Huang, Tie Jiang Wu, Chin-Ling Huang, Yu-Wei Ting | 2007-05-15 |
| 7091545 | Memory device and fabrication method thereof | Tieh-Chiang Wu, Chien-Chang Huang, Chin-Ling Huang, Yu-Wei Ting | 2006-08-15 |
| 7026647 | Device and method for detecting alignment of active areas and memory cell structures in DRAM devices | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Chin-Ling Huang | 2006-04-11 |
| 7015050 | Misalignment test structure and method thereof | Chien-Chang Huang, Tie Jiang Wu, Chin-Ling Huang, Yu-Wei Ting | 2006-03-21 |
| 6984534 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Chin-Ling Huang | 2006-01-10 |
| 6946678 | Test key for validating the position of a word line overlaying a trench capacitor in DRAMs | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting | 2005-09-20 |
| 6902942 | Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Chin-Ling Huang | 2005-06-07 |
| 6891216 | Test structure of DRAM | Chien-Chang Huang, Tie Jiang Wu, Chin-Ling Huang, Yu-Wei Ting | 2005-05-10 |
| 6875654 | Memory device and fabrication method thereof | Tieh-Chiang Wu, Chien-Chang Huang, Chin-Ling Huang, Yu-Wei Ting | 2005-04-05 |
| 6844207 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Chin-Ling Huang | 2005-01-18 |
| 6838296 | Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting | 2005-01-04 |
| 6825053 | Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMS | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting | 2004-11-30 |
| 6812487 | Test key and method for validating the doping concentration of buried layers within a deep trench capacitors | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Tse-Main Kuo | 2004-11-02 |
| 6790735 | Method of forming source/drain regions in semiconductor devices | Hui-Min Mao, Sheng-Tsung Chen, Yi-Nan Chen, Chih-Yuan Hsiao | 2004-09-14 |
| 6693834 | Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting | 2004-02-17 |