Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7381575 | Device and method for detecting alignment of active areas and memory cell structures in DRAM devices | Chien-Chang Huang, Bo Ching Jiang, Yu-Wei Ting, Chin-Ling Huang | 2008-06-03 |
| 7217581 | Misalignment test structure and method thereof | Chien-Chang Huang, Chin-Ling Huang, Yu-Wei Ting, Bo Ching Jiang | 2007-05-15 |
| 7026647 | Device and method for detecting alignment of active areas and memory cell structures in DRAM devices | Chien-Chang Huang, Bo Ching Jiang, Yu-Wei Ting, Chin-Ling Huang | 2006-04-11 |
| 7015050 | Misalignment test structure and method thereof | Chien-Chang Huang, Chin-Ling Huang, Yu-Wei Ting, Bo Ching Jiang | 2006-03-21 |
| 6984534 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang, Chin-Ling Huang | 2006-01-10 |
| 6946678 | Test key for validating the position of a word line overlaying a trench capacitor in DRAMs | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2005-09-20 |
| 6902942 | Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices | Chien-Chang Huang, Bo Ching Jiang, Yu-Wei Ting, Chin-Ling Huang | 2005-06-07 |
| 6891216 | Test structure of DRAM | Chien-Chang Huang, Chin-Ling Huang, Yu-Wei Ting, Bo Ching Jiang | 2005-05-10 |
| 6844207 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang, Chin-Ling Huang | 2005-01-18 |
| 6838296 | Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices | Chien-Chang Huang, Bo Ching Jiang, Yu-Wei Ting | 2005-01-04 |
| 6825053 | Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMS | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2004-11-30 |
| 6812487 | Test key and method for validating the doping concentration of buried layers within a deep trench capacitors | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang, Tse-Main Kuo | 2004-11-02 |
| 6801462 | Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices | Ming-Cheng Chang, Jeng-Ping Lin | 2004-10-05 |
| 6788598 | Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof | Ming-Cheng Chang, Jeng-Ping Lin, Tse-Main Kuo, Hsu-Cheng Fan | 2004-09-07 |
| 6693834 | Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices | Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2004-02-17 |