Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6812487 | Test key and method for validating the doping concentration of buried layers within a deep trench capacitors | Tie Jiang Wu, Chien-Chang Huang, Yu-Wei Ting, Bo Ching Jiang | 2004-11-02 |
| 6788598 | Test key for detecting overlap between active area and deep trench capacitor of a DRAM and detection method thereof | Ming-Cheng Chang, Tie Jiang Wu, Jeng-Ping Lin, Hsu-Cheng Fan | 2004-09-07 |