Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174131 | Quantitative analysis apparatus, method and program and manufacturing control system | Takahiro Kuzumaki, Tetsuya Ozawa, Miki Kasari, Akihiro Himeda, Takayuki Konya | 2024-12-24 |
| 11300529 | Analysis apparatus, analysis method and analysis program | Takayuki Konya, Go Fujinawa, Akihiro Himeda | 2022-04-12 |
| 8903044 | X-ray diffraction apparatus | Sigematsu Asano, Ichiro Tobita, Takayuki Konya | 2014-12-02 |