Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6096637 | Electromigration-resistant via structure | Tirunelveli S. Sriram, John J. Maziarz, Vladimir Bolkhovsky | 2000-08-01 |
| 5788869 | Methodology for in situ etch stop detection and control of plasma etching process and device design to minimize process chamber contamination | Timothy J. Dalton, Jamshed Dubash, Marion Garver, Richard A. Bickford | 1998-08-04 |