AM

Alain Moussa

IV Imec Vzw: 1 patents #463 of 1,046Top 45%
KL Katholieke Universiteit Leuven: 1 patents #233 of 754Top 35%
Overall (All Time): #2,406,093 of 4,157,543Top 60%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12278086 Pattern height metrology using an e-beam system Gian Francesco Lorusso, Mohamed Saib, Anne-Laure Charley, Danilo De Simone, Joren Severi 2025-04-15