Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7283659 | Apparatus and methods for searching through and analyzing defect images and wafer maps | Prashant Aji, James L. Belliveau, Chacko C. Neroth | 2007-10-16 |
| 6952653 | Single tool defect classification solution | Gabor Toth | 2005-10-04 |
| 6770879 | Motion picture output from electron microscope | Amir Azordegan, Christopher F. Bevis, Bharat Marathe | 2004-08-03 |