CN

Chacko C. Neroth

KL Kla-Tencor: 1 patents #316 of 626Top 55%
Overall (All Time): #3,398,597 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7283659 Apparatus and methods for searching through and analyzing defect images and wafer maps David R. Bakker, Prashant Aji, James L. Belliveau 2007-10-16