DM

David C. McClure

SS Stmicroelectronics Sa: 243 patents #793 of 4,662Top 20%
SS Sgs-Thomson Microelectronics S.A.: 3 patents #267 of 957Top 30%
ME Medtronic: 2 patents #3,096 of 6,325Top 50%
SN Stmicroelectronics International N.V.: 1 patents #346 of 696Top 50%
📍 Carrollton, TX: #2 of 1,041 inventorsTop 1%
🗺 Texas: #52 of 125,132 inventorsTop 1%
Overall (All Time): #2,193 of 4,157,543Top 1%
241
Patents All Time

Issued Patents All Time

Showing 51–75 of 241 patents

Patent #TitleCo-InventorsDate
6365991 Method and structure for measurement of a multiple-power-source device during a test mode Tom Youssef 2002-04-02
6359819 Circuit and method for performing a stress test on a ferroelectric memory device 2002-03-19
6347381 Test mode circuitry for electronic storage devices and the like 2002-02-12
6310485 Integrated circuit device having a burn-in mode for which entry into and exit from can be controlled 2001-10-30
6297996 Test mode activation and data override 2001-10-02
6295224 Circuit and method of fabricating a memory cell for a static random access memory Tsiu C. Chan, Mehdi Zamanian 2001-09-25
6294939 Device and method for data input buffering 2001-09-25
6281734 Reference voltage adjustment Rong Yin 2001-08-28
6262617 Integrated circuit output driver 2001-07-17
6252447 Edge transition detection circuit with variable impedance delay elements 2001-06-26
6144594 Test mode activation and data override 2000-11-07
6101618 Method and device for acquiring redundancy information from a packaged memory chip 2000-08-08
6081466 Stress test mode entry at power up for low/zero power memories Tom Youssef 2000-06-27
6075742 Integrated circuit for switching from power supply to battery, integrated latch lock, and associated method for same Tom Youssef 2000-06-13
6072732 Self-timed write reset pulse generation 2000-06-06
6059450 Edge transition detection circuitry for use with test mode operation of an integrated circuit memory device 2000-05-09
6041000 Initialization for fuse control Tom Youssef 2000-03-21
6037792 Burn-in stress test mode 2000-03-14
6037799 Circuit and method for selecting a signal 2000-03-14
6034917 Control circuit for terminating a memory access cycle in a memory block of an electronic storage device Tom Youssef 2000-03-07
6014050 Variable impedance delay elements 2000-01-11
6006339 Circuit and method for setting the time duration of a write to a memory cell 1999-12-21
5995444 Edge transition detection control of a memory device 1999-11-30
5986914 Active hierarchical bitline memory architecture 1999-11-16
5959910 Sense amplifier control of a memory device 1999-09-28