Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921421 | Overlay correcting method, and photolithography method, semiconductor device manufacturing method and scanner system based on the overlay correcting method | Jeongjin Lee, Minseok Kang, Seungyoon Lee | 2024-03-05 |
| 11537042 | Overlay correcting method, and photolithography method, semiconductor device manufacturing method and scanner system based on the overlay correcting method | Jeongjin Lee, Minseok Kang, Seungyoon Lee | 2022-12-27 |
| 11456222 | Overlay correction method and semiconductor fabrication method including the same | Woo Yong Jung, Jinsun KIM, Seungyoon Lee, Jeongjin Lee | 2022-09-27 |
| 11422455 | EUV exposure apparatus, and overlay correction method and semiconductor device fabricating method using the same | Doogyu Lee, Seungyoon Lee, Jeongjin Lee | 2022-08-23 |
| 11137673 | EUV exposure apparatus, and overlay correction method and semiconductor device fabricating method using the same | Doogyu Lee, Seungyoon Lee, Jeongjin Lee | 2021-10-05 |
| 10566252 | Overlay-correction method and a control system using the same | Seungyoon Lee | 2020-02-18 |
| 10444276 | Computing device executing program performing method of analyzing power noise in semiconductor device, semiconductor device design method, and program storage medium storing program | Young-Hoe Cheon | 2019-10-15 |
| 10198541 | Circuit modeling system and circuit modeling method based on net list simplification technique | Soo-Yung Ahn, Young-Hoe Cheon | 2019-02-05 |
| 10119811 | Alignment mark, method of measuring wafer alignment, and method of manufacturing a semiconductor device using the method of measuring wafer alignment | Seung Yoon Lee, Jeong Jin Lee | 2018-11-06 |
| 9958495 | Computing device executing program performing method of analyzing power noise in semiconductor device, semiconductor device design method, and program storage medium storing program | Young-Hoe Cheon | 2018-05-01 |
| 9747682 | Methods for measuring overlays | Jeongjin Lee, Seungyoon Lee | 2017-08-29 |
| 9465900 | System and method for designing semiconductor package using computing system, apparatus for fabricating semiconductor package including the system, and semiconductor package designed by the method | Jae-hoon Jeong, Won Cheol LEE, Young-Hoe Cheon, Bo-Sun Hwang | 2016-10-11 |
| 9281250 | Method of detecting an asymmetric portion of an overlay mark and method of measuring an overlay including the same | Seung Hwa Oh, Jeong Jin Lee | 2016-03-08 |
| 7799490 | Optical masks and methods for measuring aberration of a beam | Suk-Joo Lee, Han-ku Cho, Sang-Gyun Woo | 2010-09-21 |
| 7670725 | Optical masks and methods for measuring aberration of a beam | Suk-Joo Lee, Han-ku Cho, Sang-Gyun Woo | 2010-03-02 |
| 6539528 | Methods, systems, and computer program products for designing an integrated circuit that use an information repository having circuit block layout information | Yong Jin Lee, Dae Hee Lee, Jong-Bae Lee | 2003-03-25 |