WY

Wai Loon Yip

IN Intel: 1 patents #18,218 of 30,777Top 60%
Overall (All Time): #2,687,425 of 4,157,543Top 65%
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Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11476168 Die stack override for die testing Terrence Huat Hin Tan, Rehan Sheikh, Michael T. Klinglesmith, Sukhbinder Takhar, Shi Hou Chong +3 more 2022-10-18