Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6990621 | Enabling at speed application of test patterns associated with a wide tester interface on a low pin count tester | Kailasnath Maneparambil | 2006-01-24 |
| 6948096 | Functional random instruction testing (FRIT) method for complex devices such as microprocessors | Kailasnath Maneparambil, William Lindsay | 2005-09-20 |
| 6928638 | Tool for generating a re-generative functional test | Kailasnath Maneparambil, William Lindsay, Kamalnayan Jayaraman, Geliang Zhou | 2005-08-09 |
| 6032278 | Method and apparatus for performing scan testing | Fred Gruner | 2000-02-29 |
| 5978944 | Method and apparatus for scan testing dynamic circuits | Fred Gruner | 1999-11-02 |
| 5968194 | Method for application of weighted random patterns to partial scan designs | David M. Wu, Naga Gollakota | 1999-10-19 |
| 5872795 | Method and apparatus for scan testing of multi-phase logic | Fred Gruner | 1999-02-16 |