Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6990621 | Enabling at speed application of test patterns associated with a wide tester interface on a low pin count tester | Praveen Parvathala | 2006-01-24 |
| 6948096 | Functional random instruction testing (FRIT) method for complex devices such as microprocessors | Praveen Parvathala, William Lindsay | 2005-09-20 |
| 6928638 | Tool for generating a re-generative functional test | Praveen Parvathala, William Lindsay, Kamalnayan Jayaraman, Geliang Zhou | 2005-08-09 |
| 6748352 | Method and apparatus for scan design using a formal verification-based process | Joel T. Yuen, Puneet Singh | 2004-06-08 |