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Automatic test configuration generation facilitating repair of programmable circuits |
Jayabrata Ghosh Dastidar, Adam Wright |
2008-08-05 |
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Method of maintaining signal integrity across a capacitive coupled solder bump |
Michael Harms, Eric Choong-Yin Chang, John DiCosola, Mandrita Brahmachari |
2008-01-15 |
| 7301836 |
Feature control circuitry for testing integrated circuits |
Dhananjay Raghavan |
2007-11-27 |
| 7237106 |
System for loading configuration data into a configuration word register by independently loading a plurality of configuration blocks through a plurality of configuration inputs |
Adam Wright |
2007-06-26 |
| 7103813 |
Method and apparatus for testing interconnect bridging faults in an FPGA |
Anthony Pang, Andy L. Lee, Adam Wright, Rahul Saini |
2006-09-05 |
| 7058534 |
Method and apparatus for application specific test of PLDs |
Michael Harms, Jayabrata Ghosh Dastidar, Steven Perry |
2006-06-06 |
| 7024327 |
Techniques for automatically generating tests for programmable circuits |
Jayabrata Ghosh Dastidar, Adam Wright, Hung Hing Anthony Pang, Binh Vo, Ajay Nagarandal +1 more |
2006-04-04 |
| 7005875 |
Built-in self-test circuitry for integrated circuits |
Balaji Natarajan |
2006-02-28 |