Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216150 | On-die aging measurements for dynamic timing modeling | Dheeraj Subbareddy, Ankireddy Nalamalpu, Mahesh A. Iyer | 2025-02-04 |
| 11609262 | On-die aging measurements for dynamic timing modeling | Dheeraj Subbareddy, Ankireddy Nalamalpu, Mahesh A. Iyer | 2023-03-21 |
| 8531196 | Delay test circuitry | Jaydev Amit Shelat, Zunhang Yu Kasnavi | 2013-09-10 |
| 7301836 | Feature control circuitry for testing integrated circuits | Paul Tracy | 2007-11-27 |