Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11808813 | Apparatus and method for controlling unit specific junction temperature with high temporal resolution for concurrent central processing unit (CPU) core testing | Shoujie He, Christopher Wade Ackerman, Jacob Hales, Johnny Mata Vega, Joseph Zearing | 2023-11-07 |
| 7330993 | Slew rate control mechanism | Mark A. Beiley, Luke A. Johnson | 2008-02-12 |