Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11808813 | Apparatus and method for controlling unit specific junction temperature with high temporal resolution for concurrent central processing unit (CPU) core testing | Mahesh Deshmane, Shoujie He, Christopher Wade Ackerman, Johnny Mata Vega, Joseph Zearing | 2023-11-07 |