Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8701072 | Method and system for rapidly identifying silicon manufacturing defects | Phong T. Cao | 2014-04-15 |
| 8141026 | Method and system for rapidly identifying silicon manufacturing defects | Phong T. Cao | 2012-03-20 |
| 7546507 | Method and apparatus for debugging semiconductor devices | Adam Wright, Yoke Mooi Lee | 2009-06-09 |
| 7401317 | Method and system for rapidly identifying silicon manufacturing defects | Phong T. Cao | 2008-07-15 |