Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8701072 | Method and system for rapidly identifying silicon manufacturing defects | Daniel L. Reilly | 2014-04-15 |
| 8141026 | Method and system for rapidly identifying silicon manufacturing defects | Daniel L. Reilly | 2012-03-20 |
| 7401317 | Method and system for rapidly identifying silicon manufacturing defects | Daniel L. Reilly | 2008-07-15 |