Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7019550 | Leakage testing for differential signal transceiver | Eric R. Wehage, Kersi H. Vakil | 2006-03-28 |
| 6477674 | Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements | Sarah E. Bates, R. Tim Frodsham, Nasser A. Kurd, David O'Brien, Rajay R. Pai +2 more | 2002-11-05 |
| 5559745 | Static random access memory SRAM having weak write test circuit | Jashojiban Banik, Glenn F. King, Doug Guddat | 1996-09-24 |