SB

Sarah E. Bates

IN Intel: 3 patents #10,349 of 30,777Top 35%
Overall (All Time): #1,615,168 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6477674 Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements R. Tim Frodsham, Nasser A. Kurd, Anne Meixner, David O'Brien, Rajay R. Pai +2 more 2002-11-05
6367074 Operation of a system T. Andrew Crump 2002-04-02
6265893 Signal line drivers 2001-07-24